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This paper analyzes local lattice rotations introduced in severely deformed polycrystalline titanium by friction stir welding. Nondestructive three-dimensional (3D) spatially resolved polychromatic X-ray microdiffraction, is used to resolve the local crystal structure of the restructured surface from neighboring local structures in the sample material. The measurements reveal strong gradients of strain...
Composite films of nano-size nickel grains embedded in a carbonaceous matrix are synthesized by a PVD process of C 60 fullerenes and Ni acetate. The morphology of the nano-composite films is characterized by TEM, selected area electron diffraction, chemical analysis and AFM. Correlations with deposition parameters and typical structure changes are found. The mechanical properties are analyzed...
Luminescence properties of 100-μm thick GaN epilayers grown by hydride vapor phase epitaxy (HVPE) over three different substrates: high-pressure grown n-type bulk GaN (HP-n-GaN), high-pressure bulk GaN doped with magnesium (HP-GaN:Mg), and free-standing HVPE lifted-off from sapphire (FS-HVPE-GaN), were compared by means of one-photon and two-photon excitations. The contribution of carrier capture...
The influence of oxygen partial pressure during the deposition of piezoelectric strontium-doped lead zirconate titanate thin films is reported. The thin films have been deposited by RF magnetron sputtering in an atmosphere of high purity argon and oxygen (in the ratio of 9:1), on platinum-coated silicon substrates (heated to 650°C). The influence of oxygen partial pressure is studied to understand...
This article discusses the results of transmission electron microscopy (TEM)-based investigation of nickel silicide (NiSi) thin films grown on silicon. Nickel silicide is currently used as the CMOS technology standard for local interconnects and in electrical contacts. Films were characterized with a range of TEM-based techniques along with glancing angle X-ray diffraction. The nickel silicide thin...
Calcium phosphate layers were deposited on Ti6Al4V substrates with TiN buffer layers by use of pulsed laser deposition method. With this technique three pressed pellets consisted of tricalcium phosphate (TCP, Ca 3 (PO 4 ) 2 ), hydroxyapatite (HA, Ca 10 (PO 4 ) 6 (OH) 2 ) and hydroxyapatite-doped with magnesium (HA with 4% of Mg and trace amount...
The effect of the oxygen plasma treatment on the electronic states of multi-wall carbon nanotubes (MWCNTs) is analyzed by X-ray photoemission measurements (XPS) and UPS, both using synchrotron radiation. It is found that the plasma treatment effectively grafts oxygen at the CNT-surface. Thereafter, the interaction between evaporated Pd and pristine or oxygen plasma-treated MWCNTs is investigated....
Amorphous structure of Ti 25 Zr 17 Ni 29 Cu 29 composition was studied. Alloys were prepared either by rapid solidification using melt spinning or by high-energy ball milling. The composition of multi-component eutectic in slowly cooled samples of ZrNiTiCu alloy was determined using EDS measurements in scanning microscope of slowly cooled cast samples. The alloys of...
The chemical structure and possible hydro-oxidation of LaNiO 3−δ films were studied by means of tuneable high-energy X-ray photoelectron spectroscopy using synchrotron radiation. It was shown that the hydroxyl-containing phase, located near the film surface, may be attributed to the lanthanum and nickel hydroxide species. The thickness of a hydroxide-enriched layer was estimated from the oxide/hydroxide...
Herein we demonstrate the epitaxial stabilization of single-crystalline (Gd x La 1−x ) 2 O 3 films on n-GaAs (001) with a controlled lattice match. (Gd x La 1−x ) 2 O 3 films have an in-plane epitaxial relationship with a twofold rotation on GaAs (001). Spectroscopic characterization by photoemission and absorption confirms that the band...
Due to the differences in etch-pit morphologies, chemical etching offers a possibility to determine densities of dislocations in respect to their type. In the present paper we propose a method, which implements a simple shape-from-shading procedure, i.e. with results derived from image brightness dependence on surface slope. It allows estimation of etch-pit depth distributions from scanning electron...
This article reports on the in situ analysis of nickel silicide (NiSi) thin films formed by thermal processing of nickel thin films deposited on silicon substrates. The in situ techniques employed for this study include micro-Raman spectroscopy (μRS) and X-ray diffraction (XRD); in both cases the variations for temperatures up to 350°C has been studied. Nickel silicide thin films formed by vacuum...
High-resolution Rutherford backscattering spectrometry (HRBS) in combination with grazing angle argon sputtering was carried out to characterize the interface of aluminum–nickel (Al–Ni) alloy and amorphous-silicon films in a thin film transistor (TFT) for liquid crystal display (LCD). After thinning the top Al–Ni layer by a 1-keV Ar sputtering, the sensitivity of the interface oxygen was improved...
Ferrous shape memory alloys (SMAs) are often thought to become a new, important group of SMAs. The shape memory effect in these alloys is based on the reversible, stress-induced martensitic transformation of austenite to ɛ martensite. The identification and quantification of ɛ martensite is crucial when evaluating the shape memory behaviour of this material.Previous work displayed that promising results...
The different lithium niobate crystals with opposite domain structure (ODLN) were studied in the SEM using e-beam negative surface charging. In the ODLN the polarization vector Ps alternates periodically “tail-to-tail” and “head-to-head” and arranges perpendicular to the domain boundaries. In the investigation we have used congruent LiNbO 3 crystals (CLN) and Cr 2 O 3 - and...
Investigations of complex nanostructured materials used in modern technologies require special experimental techniques able to provide information on the structure and electronic properties of materials with a spatial resolution down to the nanometer scale. We tried to address these needs through the combination of X-ray absorption spectroscopy (XAS) using synchrotron radiation microbeams with scanning...
Thin film structures consisting of nano-crystalline and amorphous silicon layers deposited on glass by plasma enhanced chemical vapour deposition have been studied by optical spectroscopy methods (transmittance, photo-thermal deflection spectroscopy and photo-current spectroscopy) while structure was examined by Raman spectroscopy. The nano-crystalline layers were grown on the same amorphous layers,...
Polyurethane (PU) matrix composites were prepared with various carbon fillers at different filler contents in order to investigate their structure, mechanical and microwave absorbing properties. As fillers, flat carbon microparticles, carbon microfibers and multiwalled carbon nanotubes (MWNT) were used. The microstructure of the composite was examined by scanning electron microscopy and transmission...
This article discusses the formation and detailed materials characterisation of nickel silicide thin films. Nickel silicide thin films have been formed by thermally reacting electron beam evaporated thin films of nickel with silicon. The nickel silicide thin films have been analysed using Auger electron spectroscopy (AES) depth profiles, secondary ion mass spectrometry (SIMS), and Rutherford backscattering...
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